Participating Group (2020-2021)
Dynamical Measurement of Soft Crystals Characteristics by Diffracted X-ray Blinking
The diffracted X-ray blinking (DXB) monitors the nanoscale dynamics of samples by acquiring high-speed time-resolved images of Laue diffraction pattern with monochromatic X-rays. Here, I apply the DXB measurement to soft crystals and perform the label-free DXB using the diffraction intensity of the crystals themselves. My aim is to characterize the dynamical properties of soft crystals under a macromechanical control at different spatial scales: the rotational motion of crystal grains and the structural fluctuations of the crystal lattice planes. Using laboratory XRD, I will perform screening tests for sample selection and for optimization of sample condition. To exceed the limitation of detection accuracy of motional components, I try to improve the current DXB analytical method by using high-order data analyses such as Bayesian analysis and sparse modeling. In addition, I will measure on ultra-high-resolution diffracted X-ray measurement at synchrotron radiation. I show that our novel measurement can capture the structure-specific dynamic properties in soft crystals.